Capacitor Analyzer 6632C
10MHz

Application

6632C with Built-in ESR Measurement and Sweep Analysis

From the perspective of an equivalent circuit model, real capacitors are not ideal components. They consist of capacitance (C) along with parasitic elements such as Equivalent Series Resistance (ESR) and Equivalent Series Inductance (ESL).

ESR originates from the electrode, leads, dielectric, and internal structure, appearing as a small series resistance. It causes energy loss and heat generation, especially at low to mid frequencies, affecting both efficiency and lifespan.
ESL is mainly due to lead wires, internal stacking, and packaging, and becomes significant at high frequencies. When capacitance and ESL resonate, the Self-Resonant Frequency (SRF) occurs. Beyond this point, the capacitor behaves inductively and can no longer perform effective filtering or decoupling.

6632C Capacitor Analyzer supports high-frequency measurements from 10 Hz to 10 MHz. It features a built-in ESR (Equivalent Series Resistance) function that allows quick RESR readings in Meter Mode, helping engineers assess capacitor loss and thermal stability in real time.

In Sweep Mode, it analyzes impedance (Z) and phase (θ) versus frequency to identify the Self-Resonant Frequency (SRF). By evaluating the capacitor’s frequency response, engineers can better understand performance across operating frequencies, optimizing filter, decoupling, and power designs for improved reliability and efficiency.

Built-in the Dielectric constant-εr

Many materials in everyday life possess electrical properties related to dielectrics, such as the DC bus capacitors used in new energy vehicles, which require dielectric materials with high dielectric constants.
For electric vehicles, the performance of the power battery directly determines the range capability, and the dielectric properties of the battery's electrode materials are key to performance.

The relative dielectric constant can be measured using the 6632C Capacitor Analyzer, which provides an AC excitation signal to the material while simultaneously monitoring the actual voltage across it. By measuring the material's dimensions and its capacitance value along with the loss factor D, the material’s relative dielectric constant εr is obtained.

The 6632C can be equipped with the following material test fixtures for dielectric constant and permeability measurements.

6632C supports DC Bias Voltage measurement function

Built-in 12V and external 40V/200V/600V/2000V

In electronic circuits, capacitors serve filtering, decoupling, energy storage, and voltage stabilization, but their capacitance can drop sharply
under DC bias. Applied DC voltage suppresses dielectric polarization, especially in high‑k ceramics, leading to significant capacitance loss.
Ignoring this effect in power modules, decoupling networks, DC‑DC converters, or high speed communications can cause increased ripple,
instability, and EMI issues.
MICROTEST 6632C built‑in ±12 V DC Bias voltage measurement capability for precise analysis of capacitor bias characteristics. Additionally, it
offers the following external DC Bias testing solutions:

Accessories

Standard Accessories

Power Cord
DIP Test Fixture (FX-000C19)

MLCC｜Option

For MLCC (Class 2) -Automatic Level Compensation Fixture
Automatic Level Compensation Fixture    (FX-LR0001)
SMD Component Testing Fixture    (FX-000C12)

Optional Accessories

PC Link Software
DIP Test Fixture (F423503)
DIP Test Fixture (F423504)
SMD Test Fixture (F423905)
Kelvin Clip Leads (F423906A)
Bottom Electrode SMD Test Fixture (FX-000C10)
SMD Tweezer Test Leads (FX-000C11)
SMD Test Fixture (FX-000C12)
Dielectric Material Test Fixture (FX-0000C7)
Liquid Dielectric Material Test Fixture (FX-000C20)
Magnetic Material Test Fixture (FX-0000C8)
Material Testing Fixture (FX-0000C9)
External Voltage Bias (F420001)
External Voltage Bias (F420003)
External Voltage Bias (F420006)
BNC Test Leads (F663001 A/B/C)

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