MICROTEST 7750 Series is an advanced Impulse Winding Tester with a faster color display screen. It provides pulse voltage outputs of 1200V/5200V/10000V and utilizes high-speed sampling technology at 200MHz/9 bits. It offers various comparison modes such as total area, area difference, corona count, jitter count, second-order differentiation, and waveform comparison. With a testing speed of up to 10 times per second, it is ideal for high-speed production lines.
For testing small components, the optional 7750-1S tester comes with the FX-IM0001 four-wire SMD component testing fixture. It features voltage compensation to minimize voltage errors caused by wiring and equivalent inductance, ensuring accurate quality control for products with small inductance.
Selection
Model | 7750-1S | 7750-1F | 7750-5E | 7750-5H | 7750-5S | 7759 | 7750-10S |
Channel | 1 | 1 | 1 | 1 | 1 | 9 | 1 |
Sampling Rate | 200MHz/ 9bit | 200MHz/ 9bit | 50MHz/ 9bit | 100MHz/ 9bit | 200MHz/ 9bit | 200MHz/ 9bit | 200MHz/ 9bit |
Voltage Output | 10V-1200V | 100V-5200V | 200V-10000V | ||||
Lowest Inductance | ≥ 0.1μH | ≥ 0.1μH | ≥ 16μH | ≥ 4μH | ≥ 1μH | ≥ 1μH | ≥ 20μH |
Test Time | 10 times/ Sec | ||||||
Breakdown Voltage Test | ● | ● | - | - | ● | ● | ● |
LAN Interface | ● | ● | - | - | ● | ● | ● |
Waveform Analysis | |||||||
Total area comparison | ● | ● | ● | ● | ● | ● | ● |
Differential area comparison | ● | ● | ● | ● | ● | ● | ● |
LAPLACIAN Comparison | ● | ● | - | ● | ● | ● | ● |
Corona comparison | ● | ● | ● | ● | ● | ● | ● |
FLUT Comparison | ● | ● | ● | ● | ● | ● | ● |
COMP Comparison | ● | ● | ● | ● | ● | ● | ● |
SPEC
Pulse Number | Max. 32 | |
Input Impedance | 20MΩ | |
Measurement Statistics | ● | |
Provides 6 waveform comparison | ||
Total area comparison |
When layer short happened, the loss of power on coil increase, the resonance damping coefficient increase, resonance amplitude decrease, the total area decrease. These are the basic parameters we check layer short.
By calculating and comparing the deference of area between golden sample and DUT.
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Differential area comparison |
Add up the difference between normal wave and DUT wave call “ Area differential”.
By calculating and comparing the deference of area between golden sample and DUT. To determine the degree of waveform overlap. |
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Corona comparison |
In pulse test, the insulation defect will cause discharge and create corona. This function is able to count the times that corona happened base on the degree of deviation.
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LAPLACIAN Comparison |
Poor insulation quality of the coil results in discharge under high voltage impact, causing rapid changes in the oscillation waveform. By employing the 7750 second-order differentiation algorithm, the maximum discharge capacity is obtained, effectively detecting quality issues related to electrical leakage caused by poor solder joints in the monolithic inductor. |
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COMP Comparison |
By setting an allowable waveform range for the standard wave, this feature can simultaneously determine the |
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FLUT Comparison |
When there is inter-turn discharge in the winding coil, the waveform will exhibit tremors or fluctuations. Therefore, the instrument quantifies the degree of waveform tremors into numerical values for comparison. |
SYSTEM
PLC Remote Control | Test、About |
PLC Remote Output Signal | PASS、FAIL、HV Output、Testing |
Built-in Storage | 200 sets testing waveform |
Power Supply | Voltage:98Vac-132Vac 或192Vac-264Vac |
Frequency:50/60Hz ±5% | |
Power consumption | 45VA |
Environment | Temperature:10℃-40℃ |
Humidity:20-80%RH | |
Dimension | 430x132x370 mm (W*H*D) |
Weight | 7Kg |
Interface |
USB Host/Device、RS-232、Remote、LAN GPIB (Option) |
Display | 7" dot-matrix (800*480 ) |